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DON'T MISS THIS INCREDIBLY INFORMATIVE SHORT COURSE ON E-O TESTING!!!
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SIGN UP TODAY FOR SBIR'S SHORT COURSE...
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E-O Testing Theory - a discussion on industry standard IR/Vis tests and why we perform them
When: Tuesday, March 5th, 2013 at 8:30 am Pacific Standard Time -
Duration: 6 hours broken into 2 3-hour sessions with a 1 hour lunch break.
Snapshot: Explore the world of E-O testing theory with Alan Irwin - a systems level software engineer with over 34 years of experience in the e-o field. Alan is also the original developer of SBIR's automated test software. In this 6 hour webinar, Alan will cover the basic Infrared (IR) and Visible tests that camera and sensor manufacturers are most interested in performing. He will discuss why the tests are important and industry standard (and sometimes not so standard) methodologies for performing these tests.
ABOUT THE SPEAKER: Alan Irwin is a systems and software engineer with over 34 years of experience in the E-O test automation field. Developing IR test instrumentation since 1979, he's the originator and lead architect for SBIR's IRWindows test automation suite, which is now in its 4th generation and is deployed in laboratories, production floors, and repair depots. He's also the author of numerous SPIE publications including most recently: "Rapid electro-optical (EO) TPS development in a military environment" and "A common architecture for TPS development".
His lively, interactive approach to webinar presentations cover all facets of the testing process and theory behind the tests. Don't miss this highly informative presentation.
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More Program Details...
YOU'RE INVITED: Please join us for the 6-hour (broken into 2 3-hour sessions with a 1 hour lunch break) webinar conference EO Testing Theory-a discussion on industry standard IR/Vis tests and why we perform them on Tuesday, March 5th beginning at 8:30 am Pacific Standard Time.
COURSE DESCRIPTION: Join us for this 6-hour webinar, where automated e-o testing application engineer Mr. Alan Irwin will explain to attendees:
- IR and Visible test definitions including:
- Bad Pixel Detection
- Signal Transfer Function (SiTF) - IR and Responsivity - Visible
- Modulation Transfer Function (MTF) - IR/Visible
- 3D Noise Equivalent Temperature Difference (NETD) - IR and Noise Equivalent Input (NEI) - Visible
- Minimum Resolvable Temperature Difference (MRTD) - IR and Minimum Resolvable Contrast (MRC) - Visible
- Multi-sensor Boresight
- Uniformity - IR/Visible
- What equipment is required to perform the above tests?
- Why it is important to perform these tests?
- Examples of how to set up and run tests
- How to analyze and interpret test results and an overview of typical and atypical results.
PRICE: $299 per person to attend the live conference. If you are unable to attend the live conference, SBIR is also offering a digitally recorded version for the same $299 rate. As an add-on, you can also purchase the transcript for an additional $50.
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To Sign Up:
Contact SBIR's sales team via email at:
sales@sbir.com
or via phone at:
(805) 965-3669.
Cost: $299
Payment Method: Credit Card (Visa/MasterCard)
Duration: 6 hours total broken into 2 separate 3-hour sessions with a 1-hour lunch break
Date: Tuesday, March 5th, 2013
Time:
8:30 am to 3:30 pm Pacific Standard Time with a 1 hour lunch break
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