Do You Know about SAM?
Scanning Acoustic Microscopy
 
1. What's SAM?
 
Scanning Acoustic Microscopy (SAM) 
- Is a non-destructive analysis  shows unique insight on the integrity of package and device construction.
- Can detect void formations, delaminations, cracks and fractures or other hidden internal defects.
  
2. Types of Scan used for SAM

 

B-Scan

- Generates a top-down or X-Z axis cross-sectional image of the parts.
- Acoustic data collected along an X-Z or Y-Z plane versus depth using a reflective acoustic microscope (pulse/echo system).
  
 

C-Scan

- The C-Scan or pulse-echo provides a planar view image at a specific depth.
- Illustrations of delaminations and void formation can be generated.
- Acoustic data collected in an X-Y plane at depth (Z) using a reflective acoustic microscope (pulse/echo system)
 
  

T-Scan (Through Scan)

- Shows a two-dimensional (area) image of transmitted ultrasound through the complete thickness/depth (Z) of the sample/component
- Acoustic data collected in an X-Y plane throughout the depth (Z) using a through transmission acoustic microscope system
 
  
    
  
 
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This Week in the Lab...
Inspection Accept
79%
Electrical Testing Pass
69%
This list contains the devices that have had over 5% failure in electrical testing within one week. 
  
Click below link to get the Substandard Devices Details (part number, MFG, Date Codes, Failure Rate and Failure mode).
  
  
 Intersil ICM7170AIBG Failure - No output frequency on OSC_OUT(Pin9).
 
    
 
   2016 Events & News
 
  
 
3. Top Counterfeiting Risks Manufacturers Face in 2016

Weekly Report Archives
Substandard Parts Lists from 2009-2016
  
Click on the Weekly Quality Report page on our website and then click the "View our Archive" button to see each posting from 2009 thru 2016.
  
  
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We hope you find this report informative and usefull for your organization. 
  
 
 
 
 
All the best,

Mark A. Rinehart
White Horse Laboratories