Week 52 Quality Report



White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods

While this list does not imply that the balance of devices within a lot are defective, and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 52

Inspection Accept 

73%

 

Electrical Testing Pass

67%

This Week in The Lab...
Week 52 Substandard Parts List
Chip Cap Authenticity Test
Substandard Parts Archive
       
                                   
White Horse Laboratories' Quality Report
Week 52 Quality Report
Substandard Parts List
                       
Atheros AR9170-AL1A (Date Code 0928) - 23% Failure Rate - Shorted pins and broken protection diodes.
  
ST Microelectronics TIP147T (Date Codes 1512 and 323) - 100% Failure Rate
 - Hfe was less than 500 with -10A collector current and the Vce(sat) was more than -3.0V with -10A collector current.
  
Analog Devices AD7510DIKN (Date Code not marked or labeled) - 6% Failure Rate - Failed Id(off) with leakage above 1uA and Ron with non-matched channels.
  
Texas instruments TMS320C30GEL50 (Date Code not marked or labeled) - 21% Failure Rate - Broken protection diodes.
  
Xilinx XC4VFX40-11FFG672I (Date Code 1429) - 7% Failure Rate - Program error.
  
RAMTRON FM25V02GTR (Date Code 1023) - 5% Failure Rate - ID-check error.
  
Atheros AR9104-AL1A (Date Code 0811) - 100% Failure Rate - Shorted pins.
  
Analog Devices AD7510DIKN Failure - Failed Id(off) with leakage above 1uA and Ron with non-matched channels
Chip Cap Authenticity Verification
MLCC (Multilayer Chip Capacitor)

Purchasing passive discrete devices such as capacitors, resistors, and inductors can be challenging. It is more challenging to verify authentic product that does not have a die. They seem to work okay, but are they real?
  
White Horse Laboratories has been developing new test and inspection protocols for passive devices through extensive internal experimentation and analysis. The first such solution we are presenting is for Multilayer Chip Capacitors (MLCC). This MLCC profilegoes beyond external visual inspection (EVI) and testing basic capacitance and into how the device is constructed. The capacitance is what makes it a capacitor, the manufacturing is what makes a specific MLCC unique.

This MLCC testing profile includes:
  • Packaging & Documentation Inspection
  • External Visual Inspection (EVI)
  • XRF Material Analysis
  • Parametric electrical testing at ambient and min/max operating temperature range
  • Cross-section
  • Statistical analysis of test data
A solution was needed, and we have provided just that. Just let me know if you have any questions and/or the next time you are considering to purchase MLCC.
 
Weekly Report Archives
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Substandard Parts Lists dating back to 2009


White Horse has been publishing Weekly Quality Reports since 2009. Now we open those archives to you.

 

Simply click on the Weekly Quality Report page on our website and then click the "View our Archive" button to see each posting from 2009 thru 2015.


We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories
Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.