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Week 37 Quality Report



White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods

While this list does not imply that the balance of devices within a lot are defective, and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 37

Inspection Accept 

67%

 

Electrical Testing Pass

88%

This Week in The Lab...
Week 37 Substandard Parts List
Substandard Parts Archive

                                   
White Horse Laboratories' Quality Report
Week 37 Quality Report
Substandard Parts List
                           
Altera EP4SGX230KF40C3N (Date Code 1343) - 100% Failure Rate - Vcc pins shorted to ground and no output, cannot access the JTAG chain.
 
Xilinx XC9536-7VQ44I (Date Code 1025) - 7.5% Failure Rate - Program error, devices cannot be programmed.
 
Xilinx XC9536-7VQ44I Program Error
                                                      
Weekly Report Archives
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Substandard Parts Lists dating back to 2009


White Horse has been publishing Weekly Quality Reports since 2009. Now we open those archives to you.

 

Simply click on the Weekly Quality Report page on our website and then click the "View our Archive" button to see each posting from 2009 thru 2015.


We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories
Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.