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Week 36 Quality Report



White Horse Laboratories has been publishing our Weekly Quality Reports since 2009, which are a listing of the devices that have had over 5% lot failure in electrical testing or the buyer has rejected the lot following results of inspection methods

While this list does not imply that the balance of devices within a lot are defective, and is not exhaustive (for example, a 5% failure rate may be too high or some buyers may accept devices in a physical condition that others would not), it is intended to an indicator as to what is going on in the market and is a reminder to be aware of the risks of sourcing without adequate quality control measures in place.

Week 36

Inspection Accept 

89%

 

Electrical Testing Pass

85%

This Week in The Lab...

                                   
White Horse Laboratories' Quality Report

Week 36 Quality Report
Substandard Parts List
                           
Texas Instruments TMS320F243PGEA (Lot Code FF-13A2V8W) - 99% Failure Rate (see below) - Pin assignment and die markings match the TMS320VC5410CW device.
 
Harris Semiconductor ICL8038AMJD (Date Codes 0422, 0427, and 0436) -11% Failure Rate - No output signal and wrong frequency.
 
TMS320F243PGEA Pin Assignment Failure
Texas Instruments TMS320F243PGEA Die Markings
                                                      
Weekly Report Archives
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Substandard Parts Lists dating back to 2009


White Horse has been publishing Weekly Quality Reports since 2009. Now we open those archives to you.

 

Simply click on the Weekly Quality Report page on our website and then click the "View our Archive" button to see each posting from 2009 thru 2015.


We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories
Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.