Website Banner

Week 7 Report

 

Inspection Accept

84%

 

Electrical Testing Pass

83%

This Week in The Lab...

                                   
White Horse Laboratories' Quality Report

Week 7 Summary                                                                        

 

Week 7 was the last full week heading into the Lunar/Chinese New Year holiday. With most domestic Chinese trading companies closing on February 13, this was the last big rush of product before the prolonged holiday closures. Historically, this is one of the worst periods for product quality with so much substandard product on the move in an attempt to generate additional cash flow for the holiday period.

 

In 2015, though, Electrical Testing yields refused to decline for a 6th consecutive week!

 

Inspection yields popped back to 84% in Week 7, a three-point gain on Week 5's 81% and then resting for a week on 80%. Electrical Testing yields "stalled" at 83% in Week 7; however, the percentage was marginally higher as we do not report fractions. In this case, it was significant, as it means that yields advanced for the sixth straight week, although only inching forward from Week 6. Still, any improvement is welcomed by all.

 

Just three devices were added to the Substandard Parts List (see below).

 

Weeks 8 and 9 had marginal traffic due to the holiday; however, the results will be published this Wednesday and Thursday, so stay tuned. 

Week 7 Quality Report


Substandard Part Listing 

 

NXP Semiconductors SCC68681E1N40 - (Date Code 415) - 46% Failure Rate - Shorted pins and broken protection diodes.

 

Xilinx XC4VLX25-10SF363I - (Date Codes 1027, 1035, and 1043) - 29% Failure Rate - Program error with VccINT pin shorted to GND and wrong ID code.

 

Altera EPCS64SI16N - (Date Code 414) - 50% Failure Rate - ID-check error. 

Altera EPCS64SI16N 50% failure rate for ID-check error.
Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.

We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories