Week 26 Report

Inspection Accept

79%

Electrical Testing Pass

60%

Week 26 Summary                                                                        

Week 26 returned to a divergent pattern of Electrical Testing and Inspection yields going in different directions.

Electrical Testing yields dropped to 60% in Week 26 from 73% in Week 25, from 67% in Week 24.

There are twelve new devices added to the substandard parts list this week, two of which had a 100% failure rate.

Inspection yields improved to 79% in Week 26, up from 70% in Week 25.

Week 26 Quality Report

Substandard Part Listing 

Xilinx Corporation XC9572-10TQG100C (Date Codes 1109, 1117, and 1125) -

Xilinx Corporation  XC9536-10VQ44C (Date Code 1045) - 16% Failure Rate - Program error.

Altera EP2C8F256C8N (Date Code 1345) - 13% Failure Rate - Failed of downloading program. 

Xilinx Corporation XC95144-10TQG100I (Date Codes 0901, 1016, and 1018) - 92% Failure Rate - No output.

STMicroelectronics LM7805CV (Date Code not marked or labeled) - 100% Failure Rate - Low Vout.

Linear Technology  LT1961EMS8E (Date Code not marked or labeled) - 20% Failure Rate -  Low Vout.

Samsung CL10A105KB8NNNC (Date Code not marked or labeled) - 40% Failure Rate - Low capacitance.

Samsung CL21A22MOQNNNE (Date Code not marked or labeled) -  11% Failure Rate - Low capacitance.

Samsung CL31A226KAHNNNE (Date Code not marked or labeled) - 70% Failure Rate - Low capacitance.

Micron MT48LC32M16A2P-75:CTR (Date Codes 1226 and 1320) - 100% Failure Rate - Open pins and broken protective diodes.

Infineon Technologies SAB-C517A-LN (Date Code not marked or labeled) - 19% Failure Rate - Short pins and broken protective diodes.