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Week 25 Report

 

Inspection Accept

70%

 

Electrical Testing Pass

73%

This Week in The Lab...
Week 25 Summary
Substandard Parts List

                                   
White Horse Laboratories' Quality Report

Week 25 Summary                                                                        

 

After three weeks of relatively irregular results, Week 25 returned a sense of normalcy. Electrical Testing yields edged up 5 points from Week 24 while Inspection yields held generally steady.

 

Electrical Testing yields pushed forward to 73%, from 67% in Week 24. This is consistent with the 70-75% range we had observed for nearly two months before things got a little sporadic for a few weeks.

 

There are four new devices added to the substandard parts list this week, and two repeat offenders, for of which had a 100% failure rate.

 

Inspection yields stayed around 70%, sliding from a rounded down to a rounded up 70% from Weeks 24 to 25.

Week 25 Quality Report


Substandard Part Listing 

 

Vishay SMAJ26CA-HE3/61 (Date Code not marked or labeled ) -

38% Failure Rate
- High Id and Vbr.

Analog Devices ADM3485ARZ-REEL7 (Date Code not marked or labeled) - 100% Failure Rate - Low differential output voltage.

 

 

Lattice Semiconductor GAL20V8B-15LD/883 (Date Code 0846) - 100% Failure Rate - Wrong ID code.

 

Altera EPM5064LC-1 (Multiple Date Codes) - 100% Failure Rate - Wrong ID and poor pin contacts.

 

Altera EP2S90F1020C5N (Date Code 1409) - 21% Failure Rate - Program error and no output.

 

STMicroelectronics STFP40V60F (Date Code not marked or labeled) - 100% Failure Rate - Low Vge(th).

STMicroelectronics STFP40V60F 600V, 40A High Speed IGBT

100% Failure Rate for low gate-emitter threshold voltage, Vge(th), which should be between 5-10V and was measured at about 4V with 1mA collector current.

Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.

We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories