Week 17 Report

Inspection Accept

73%

Electrical Testing Pass

70%

This Week in The Lab...

Week 17 Summary

ES Live 2014

Substandard Part Listing

White Horse Laboratories' Quality Report

Week 17 Summary

Electrical Testing yields held their own in while Inspection yields made a significant move forward in Week 17.

Testing yields remained at 70% for the third straight week with another nine devices having a failure rate of over 5%, none of which, though, were 100%.

Inspection yields climbed to 73% in Week 17 following Week 16's edge forward to nearly 60% in Week 16 after having fell to 58% in Week 15.

ES Live 2014 - The Data Behind the Report
Thursday, May 15 - Milton Keynes, United Kingdom

The past decade has seen product verification being a rarity to it becoming the norm. Does product testing, though, confirm acceptable product quality?

This workshop will help guide you through the minefield of interpreting, and verifying, product reports to take charge of your product verification program and make informed decisions.

Mark A. Rinehart - Presenter

Week 17 Quality Report

Substandard Part Listing

Atmel ATMEGA88-20MU (Date Code 1006) - 9% Failure Rate - Program & verify error.

Xilinx XC3S1000-4FGG320I (Date Code 1219) - 15% Failure Rate - Program error.

Hitachi HD63B03XP (Date Code not marked or labeled) - 9% Failure Rate - open/short pins and bad protective diodes.

Texas Instruments DAC725JP (Date Code not marked or labeled) - 7% Failure Rate - Readings of 2.55V at +Full Scale and 7.5V at -Full Scale.

Altera ATSAM3S4BA-AU (Multiple Date Codes) - 18% Failure Rate - Poor pin contacts and blank-check error.

Xilinx XCV100-4PQ240I (Date Code 1125) - 6% Failure Rate - No output.

Xilinx XCS40-3PQG208I (Date Codes 1229 and 1237) - 10% Failure Rate - Cannot load the bitstream.

Analog Devices AD7008JP50 (Date Code not marked or labeled) - 59% Failure Rate - Open pins and broken protective diodes.

Xilinx XC2S400E-7FG456C (Date Codes 1213 and 1221) - 20% Failure Rate

Program error and no

output

Altera ATSAM3S4BA-AU: Uneven plating and solder remnants - evidence of being refurbished, which is consistent with electrical testing that shows devices have been previously programmed (fail blank-check).

Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.

We hope you find this report informative and usefull for your organization.

All the best,

Mark A. Rinehart
White Horse Laboratories