Weeks 29-30

Report

Inspection Accept

49%

Electrical Testing Pass

58%

Weeks 29-30 Summary                                                                                                          

Electrical Testing yields suffered a dizzying drop to 49% in Week 29, from 79% in Week 28, and then recovered back to 79% in Week 30, averaging just 58% for the period, down significantly from 74% in the previous period.

Ten different devices had a high failure rate in Electrical Testing, only one of which was a 100% failure rate.

Inspection results logged their third straight week of incremental gains, edging up to 49% acceptance rate for the period. Compared to the previous period, it is a significant improvement, but bear in mind that Week 28 posted a low of 32% and less than half of inspected devices being in acceptable condition is exceptionally poor.

Still, three consecutive weeks of improvement, regardless of how incremental they may be, is hopefully the beginning of an improvement trend.

Weeks 29-30 Quality Report

International Rectifier 403CMQ100 - Low Ir (Reverse Current).

NEC UPD431000ACZ-70LL (Date Code 0615) - 7% Failure Rate - Read error.

Infineon ADM6999X-A2-T-1-XP (Date Code not marked or labeled) - 63% Failure Rate - Shorted pins and bad protection diodes.

Cirrus Logic CS5504-BS (Date Code 0417) - 5% Failure Rate - DRDY doesn't go Low after starting conversion.

Vishay  SI4450DY-T1 (Date Code not marked or labeled) -50% Failure Rate - High Rds(on).

Xilinx XC9572-15PQ100I (Date Code 1035) - 62% Failure Rate - Program error and wrong ID.

Xilinx XC6VLX130T-3FFG1156C (Date Code 1228) - 40% Failure Rate - Program error caused by the VCCINT and VCCIO pins shorted to GND.

On Semiconductor CMCPCI102BR (Multiple date Codes) - 6% Failure Rate - Non-responding and shorted outputs.

International Rectifier  403CMQ100 (Date Code not marked or labeled) - 100% Failure rate - Low Ir.

Freescale MC68376BGMFT20 (Date Codes 0112,0149 and 0130) - 5% Failure rate - Open, shorted pins and bad protective diodes.