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Weeks 11-12 Report

 

Inspection Accept

67%

 

Electrical Testing Pass

63% 

This Week in The Lab...
Weeks 11-12 Summary
Substandard Part Listing
Week 12 for 2013                  
                                   
White Horse Laboratories' Quality Report
Weeks 11-12, 2013

Weeks 11-12 Summary                                                                                                          

  

Electrical Testing yields reached four straight weeks of declines, landing at 58% in Week 12 after reaching a peak of 94% in Week 9.

 

With volumes returning to normal following the Lunar New Year holiday, the list of high failure rate devices is extensive, with 8 different devices having a 100% failure rate.

 

Inspection yields dipped in Week 11 to 61% and then regrouped to land at 71% in Week 12 after reaching 75% in Week 10.

Weeks 11-12 Quality Report

Remarked
VN920DSPTR-E - parts have been remarked.

Substandard Part Listing

  

Philips BSN304 (Date Code Not marked or labeled) - 100% Failure Rate - BCVdss was about 270V with 10uA drain current.

 

Torex XC62KN3302M (Date Code not marked or labeled) - 100% Failure Rate - No output.

 

ST Microelectronics STW18NK80Z (Date Code 235) - 100% Failure Rate -  High Rds(on).

 

Xilinx XC95288XV-7TQ144C (Date Code 0641) - 100% Failure Rate

- Program error.
 

Cirrus Logic CS5317-KS (Date Code 0627) - 100% Failure Rate - Failed testing with CLKIN (Pin10) pull-down to VD-, and no output data (Pin7) and clock (Pin6).

 

ST Microelectronics ST72T141K2MCE (Date Code not marked or labeled) - 100% Failure Rate - Blank-check error.

 

ST Microelectronics VN920DSPTR-E (Date Code not marked or labeled) - 100% Failure Rate - Pin does not go high during open load condition.

 

On Semiconductor CAT24C44LI (Date Code 1026) - 100% failure Rate - Program and verify error.

 

Catalyst CAT24C44VI (Date Code not marked or labeled) - 96% Failure Rate - Program and verify error.

 

International Rectifier IRF2204SPBF (Date Code 0215) - 58% Failure Rate - Low Vgs(on).
  

Texas Instruments LM2671M-3.3/NOPB  (Date Code not marked or labeled ) - 31% Failure Rate - No output or high output.

 

Xilinx XC9572-15 (Date Code 1005) - 16% Failure Rate - Program error and wrong ID.

 

Xilinx XC95108-10PQ100C (Date Code 829) - 16% Failure Rate - Program error, wrong ID, and not output signal.

 

Intersil HA7-2645-5 (Date Codes 9617, 9743, 9745, and 0918) - 14% Failure Rate - Varied output distortions.

 

Texas Instruments 4127KG (Date Code not marked or labeled) - 13% Failure Rate - Distorted and static outputs.

 

Xilinx XC9572-15PC-84C (Date Codes 0609 and 0613) - 11% Failure Rate - Program error and wrong ID.

 

Infineon SAF-C517A-LN (Date Code 0417) - 8% Failure Rate - Open/short pins and bad protection diodes (used).

 

Xilinx XC95216-20PQ160C (Date Code 9937) - 7% Failure Rate - Program error and wrong ID.
  
Fairchild Semiconductor FQP3N40 (Date Code not marked or labeled) - 6% Failure Rate - Low Vgs(th).
  
Xilinx XC95108-20PC84C (Date Code 0819) - 6% Failure Rate - Program error and wrong ID.
Notes:

1. Statistics are calculated as a percentage of all lots dis-positioned within the given time period.

2. "Accept" is defined as customer acceptance of report device condition.

3. "Pass" is defined as meeting electrical parameters defined by the agreed upon test plan.

We hope you find this report informative and usefull for your organization.

 

All the best,

Mark A. Rinehart
White Horse Laboratories