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Week 6 Summary
Electrical Testing yields reached their highest point of 2013 by hitting 94% in Week 9 before falling back to a more modest 76% in Week 10. Both weeks had holiday-influenced volume reductions around the Lunar New Year holiday.
There was a wide range of devices with high failure rates, including discrete, linear, memory, and ASIC (application-specific integrated circuit) devices.
Inspection yields made progress in Weeks 9 and 10 after crashing to 50% in Week 7. Week 8 scratched up to 58% in Week 9 and then reached 75% in Week 10. Let's hope that is the beginning of a trend.
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Weeks 9-10 Quality Report
 | | 2SK2008 - High Igss. Specification is less than 10 microamps and measured value is greater than 100 microamps. |
Substandard Part Listing
Hitachi Semiconductor 2SK2008 (Date Code not marked or labeled) -
100% Failure Rate - High Igss.
Vishay MSP5.0A-M3/89A
(Date Code not marked or labeled) - 61% Failure Rate - Low Vbr and high Ir.
Ramtron FM25160-S (Date Code 0441) - 26% Failure Rate - Programming verify error.
Linear Technology LTC3405AES6#TRPBF (Date Code 0524) - 19% Failure Rate - High feedback voltage, low feedback voltage, and no output.
Integrated Device Technology IDT79R3081-25DL (Date Code 1024) - 13% Failure Rate - Short pins and bad protective diodes.
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