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Week 4 Summary
The fourth week of 2013 saw a pleasant jump in inspection yields, while test yields continued to erode for the third consecutive week.
Inspection yields lept to 85% in Week 4 from 63% in Week 3. Electrical Testing yields fell again to 68% in Week 4 from Week 3's 74%. See below for this week's listing of substandard parts. Most failures arose from damage and degradation caused by previous use. |
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Week 4 Quality Report
Substandard Part Listing
 | | LT1490IS8#PBF Incorrect Ouputs - Devices had been Resurfaced and Remarked |
Cirrus Logic CS5504-BS (Date Codes 0409, 0417, and 0505) - 7.3% Failure Rate - Digital data 0x0 at Half-Scale (1.25V).
Harris HD1-6409-9 (Date Code 0505) - 12.8% Failure Rate - Short pins and bad protectivde diodes.
NEC UPD70320L-8V25 (Date Codes 0415 and 0438) - 12% Failure Rate - Signal Distortion.
Xilinx XC9536-5VQG44C (Date Code 1041) - 30.36% Failure Rate- Program error.
Texas Instruments TPS5450DDAR (Date Code not marked or labeled ) - 17.05% Failure Rate - Mixed failure modes of PH-Vin short-circuit, PH-GND short-circuit, and no output. |
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