|
Week 3 Summary
The third week of 2013 saw an increase in substandard devices as both inspection and electrical testing yields declined from their Week 2 ratings.
Inspection yields dropped to 63% from Week 2's 67% in Week 2, halting a three-week run of improvements. Electrical Testing continued to errode, fading to 74% from 75% in Week 2. |
|
|
2013 Seminar Schedule
Topic Prioritization Poll
 We are continuing our schedule of seminars and work shops in April after the Lunar New Year holiday in February and a flurry of tradeshows in March.
While we are setting the schedule, the topic for the next session is UP TO YOU. What topics are most important to you? Just click to go to our online poll to vote for what most needs to be discussed and shared. |
|
|
Week 3 Quality Report
Substandard Part Listing
 | | HD1-6409-9 Shorted Pins and Bad Protective Diodes |
Harris HD1-6409-9 (Date Codes 0632 and 0648) - 12.77% Failure Rate - Short pins and bad protective diodes.
Xilinx XC9536-5VQG44C (Date Code 1041) - 22.27% Failure Rate - Program error.
Xilinx XC4020E-4HQ208I (Date Code not marked or labeled) - 7.50% Failure Rate - Can not be loaded bitstream via JTAG and PROM.
Xilinx XC95108-10PQ100C (Date Codes 0807, 0813, and 0829) - 81.25% Failure Rate- Program error and wrong ID. Xinlinx XC9572-15PQ100C (Date Code 0821) - 54.40% Failure Rate - Program error and wrong ID. |
|
