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Week 52 Summary
Week 52, the last week of 2012, finished with the same trend throughout December, with Inspection and Electrical Testing yields bouncing in opposite directions from the prior week.
Inspection yields propped back "up" to 50% after falling to 47.4% in Week 51 and Electrical Testing yields dropped down to 57% after reaching 71.4% in Week 51. See below for Week 52's substandard part listing (devices with higher than 5% failure rate in Electrical Testing).
We will be publishing a 2012 in our January newsletter, which will be published next week. Stay tuned! |
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Training Seminar
Industry Terminology & Standards
You are invited to our FREE SEMINAR to update you on current industry standards and terminology, keeping you and your customers on the same page. Seating is limited, contact Richard Chen to reserve your spot.
Mark Rinehart will be sharing his insights into the CCAP-101, AS5553, AS6081, and IDEA-STD-1010B standards and the United States' legislation that are setting the tone for the industry in 2013 and beyond. |
Huaqiang Square Hotel, January 21
Huaqiang Square Hotel
Shenzhen, China
January 21, 2013
2:00PM-4:00PM |
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Week 52 Quality Report, 2012
 | | LM2575S-ADJ Low Output with 0.2A Load |
Substandard Part Listing
Micrel MIC4125YME-TR (Date Code not marked or labeled) - 6.7% Failure Rate - No output on OUTA.
Xilinx XC95288-15HQ208I(Date Code 1028) - 28.8% Failure Rate - Program and ID error.
National Semiconductor LM2575S-ADJ (Date Code not marked or labeled) - 32.7% Failure Rate - High, low or no output (highly unstable).
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