Week 50 Report

Inspection Accept

55.0%

Electrical Testing Pass

61.9%

Weeks 50 Summary                                                                                                          

Yields in both Inspection and Electrical Testing reversed trends from Week 49 with Inspection yields recovering to 55% in Week 50 after sliding for four straight weeks, bottoming out at 50% in Week 49. Yields are based upon buyer acceptance following physical inspection identifies the condition of the devices.

Electrical Testing yields dropped to 61.9% in Week 50 after reaching 68.8% in Week 49. Note below that only one device on the list failed for open/short pins - all others are parametric failures.

FQP 3N40 Test Measurements - Low Vgs(th)

Substandard Part Listing 

Texas Instruments LM80CIMTX3/NOPB  (Date Code not marked or labeled) - 65% Failure Rate - Typical data 0xAE-0xAF (174-175, 10 mV LSB) is out of specification.

Panasonic EET-HC1J682KJ (Date Code not marked or labeled) - 9.2% Failure Rate -

Low capacitance and high DF.

Maxim MAX4452EUK+T (Date Code not marked or labeled) - 100% Failure Rate - High Is, high Vout high, and low Vout low.

Vishay  SI7850DP (Date Code not marked or labeled) - 41.7% Failure Rate - High breakdown.

Xilinx XCR3384XL-12FTG256I (Date Codes 0621 and 0725 ) - 28.6% Failure Rate - Failure loading the bitstream via JTAG and inconsistent pin-out.

Linear Technology LTC3780EG (Date Code 1215) - 50% Failure Rate - Short pins and high resistance.

Fairchild Semiconductor FQP2N40 (Date Code not marked or labeled) - 64.4% Failure Rate - High Vds,low Vgs,high Igss.

Fairchild Semiconductor FQP3N40 (Date Code not marked or labeled) - 74.3% Failure Rate- High Vds and low Vgs.