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Weeks 49 Summary
Inspection yields continued their downward trajectory again in Week 49, reaching a low of 50%, falling another 10% from Week 48's 60%. The 50% is one of the lowest yields of 2012.
Electrical testing yields ricocheted from 60.9% in Week 48 to 68.8% in Week 49. Electrical failures range from opens caused by electrical overstress during prior use or salvaging on refurbished devices to parametric failures. |
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Week 49 Quality Report, 2012
| | XC4005E-4PQ100I JTAG Test Schematic |
Substandard Part Listing
ON Semiconductor NTD25P03LT4G (Date Code 0230) - 100% Failure Rate - High Rds(on).
Analog Devices AD7685CRMZ (Date Code not marked or labeled) - 100% Failure Rate - Incorrect digital output.
Xilinx XC4005E4PQ100I (Date Code 0717) - 100% Failure Rate - Bitstream data would not load via PROM and JTAG.
Cypress Semiconductor VIC068A-BC (Date Code not marked or labeled) - 10.3% Failure Rate - Open/short pins and bad protection diodes.
Vishay 594D337X9016R2T (Date Code not marked or labeled ) - 8.51% Failure Rate - High breakdown of direct current leakage (DCL). |
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