Salland Newsletter Header wo blue line
September 8, 2011 
In This Issue
Supercharge Your J750s
Untangle Map Incompatibilities
Salland at ITC 2011
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Salland Engineering

 

X750 Product Brief

 

MapWareHouse Brochure 

 

ITC 2011

Greetings!

We have two outstanding New Product Announcements for the test floor to welcome you back from summer break. Enjoy!
10 Year Anniversary of 9/11
International Collaboration
As this weekend is the tenth anniversary of the 9/11 tragedy in New York, I am reminded how proud I am to be in the engineering profession. I think all of us, you and me, exemplify the best in international collaboration and mutual respect - the key ingredients to Peace! 

 

All of us at Salland are proud to be working with you.

 

Supercharge Your J750s Power Density by >6X


The Teradyne J750 is a popular platform for testing micro-controllers and SOC devices where high parallel, multisite testing is required. Salland is proud to introduce a major new product to our family of ATE upgrade instruments that greatly extends the capabilities of the J750. Without sacrificing any digital slots, users can now run up to 640 additional independent device power supplies (DPS). Critical for IDDQ testing, additional enhancements deliver improved measurement accuracy of low currents in low voltage and high current applications .

Supercharged J750

 

See how we take this plain black box and turn it into a supercharged prodigy! Learn how we accomplished this within a zero footprint while maintaining complete software compatibility.

 

Click here for link to Press Release and Product Data Sheet.

Full Wafer Map Management with MapWareHouse

 

Man confused by maps

Is your company losing productivity due to lost or incompatible wafer maps? Do you have maps other than wafer maps, e.g. in strip maps, that need consistent management and editing? Or are the data analysis tools you use too complicated for the majority of personnel responsible for managing the flow of wafer data? Can you easily exchange maps between your own test floors as well as with your suppliers and customers? These common challenges plus many more are addressed by MapWareHouse, a powerful new database system available now from Salland. 

 

Click here for link to Press Release and Product Data Sheet.

 

See These and More Salland Products at ITC 2011  

micky mouse w HDACTO
We look forward to meeting you at the upcoming International Test Conference being held at the Disneyland Hotel in Anaheim, California, September 18-23. We will be demonstrating these new products as well as other powerful capabilities to help you reduce the cost of test and improve your overall test efficiency.

 



 

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Send us your feedback and recommendation for future topics of interest. 

Best Regards from Paul van Ulsen