Marco Marienberg was observing yield losses of 2-5% on a high volume RF device that he is responsible for at Qualcomm in San Diego. He traced the losses to variations in the test setup. There were multiple testers, multiple subcons, probe cards, sites, etc. that made the variations impossible to predict and eliminate.  Marco came up with the idea of using SwifTest to perform dynamic transformations to correct such yield variations. Because of Marco's knowledge of the powerful capabilities of adaptive test, he resolved a major issue for Qualcomm and gave birth to a new module in the SwifTest product line called DynamIC Test.

"Pintail software solutions such as SwifTest and TestScape have been extremely successful in maintaining product quality, minimizing test time, maximizing product throughput, and monitoring all aspects of high volume production data," says Marco.  "The DynamIC Test software provides users with an elegant yet simple method of maximizing 1st pass and final test yields safely. The analysis and deployment can be done in less than 1 week, making it the easiest SwifTest module to work with."

Marco and Qualcomm were kind enough to write up their experience in comprehensive Case Study that is now available from Pintail upon request.

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