Dear Colleague
Here is some information we think you will find of value.
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 4 Years and 1 Billion Devices
Next Generation SwifTest Products Unveiled |
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In 2004 Pintail announced that Texas Instruments had qualified SwifTest™ for performing test time optimization in their worldwide test facilities using statistical sampling. At the time, the word "adaptive test" was not a common industry term. Four years later, over 1 billion devices have been shipped by Pintail customers using some form of SwifTest. Adaptive Test works! SwifTest has become the de facto industry standard in on-line adaptive test.
With all of this experience, Pintail is pleased to announce the release of 5 next generation products in the SwifTest platform. Following more than 12 months of development and lots of collaboration with our partners like Avago Technologies, the new SwifTest products offer users extended capabilities to optimize test cost, achieve extreme quality and reliability, improve yield and new product introduction time, and more effectively monitor their test operations. Click here for this week's product announcement.
One of the main reasons that SwifTest has been so successful is that it is a modular, open and scalable system. SwifTest may be installed on only one tester or hundreds of testers. There are no changes required to your current test database system or your procedures. There is no additional hardware required.
The newest products allow users to add their own adaptive test algorithms to SwifTest. We look forward to more collaboration with your IT, quality and test engineering organizations as together we explore the many possibilities for optimizing test via this most trusted real-time, adaptive test platform.
In addition, because of the volume of business driven through the test subcons by Pintail customers, SwifTest is in operation at almost every test subcon in the world today. This is further testament to its ease of use and robust performance in volume manufacturing environments. Visit our updated web site for a complete description of the new SwifTest products. |
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What Happened to the Contest for Best Outlier Detection Icon? |
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If you have been paying attention, you recall that on March 12, 2008 we launched a contest with our readers for the best metaphor for dynamic outlier detection and extraction. The winning entry came from Dr. William Harding of Quality Consultants Group, who is now proud owner of a genuine Pintail polo shirt. The FOX lends itself nicely to naming our newest SwifTest module for achieving extreme quality and reliability -
Fast Outlier Extraction - SwifTest-FOX™ |
Extreme Quality and Reliability
Introducing SwifTest-FOX™ |
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The industry learned a tough lesson in their rapid shift to using dynamic parts average testing to remove outliers as recommended by the automotive council on quality. We learned that there is a cost of quality measure by yield loss associated with rejecting outliers. One of the major improvements to the SwifTest platform is the new outlier detection and rejection product - SwifTest-FOX, that balances outlier detection effectiveness while minimizing unnecessary yield loss.
Read about why DPAT is no longer the obvious choice for outlier detection by clicking here. Pintail's SwifTest-FOX allows user to run very sophisticated outlier algorithms at various stages of the test process - comparing measurement on a single die, comparing measures from die to die, or computing outliers based upon entire lots. Algorithms such as regression and principal component analysis are now available on SwifTest-FOX in addition to DPAT. SwifTest-FOX is also one of the few products in the industry capable of performing outlier detection at both probe and final test.
A key enhancement to this generation of SwifTest products is the ability for the user to add his own proprietary algorithms. This is a great opportunity to engage the skills of your internal quality and IT organizations to build upon the SwifTest platform. |
| Meet Pintail at Upcoming Events |
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We look forward to meeting you personally at these important upcoming test events:
n Teradyne Users' Group (Austin, April 28-30)
n VLSI Test Symposium (San Diego, May 4-8)
n European Test Symposium (Italy, May 25-29) |
including your various subcons with a common view? What if you could access all of this data over the web with any browser and with only a few points & clicks? And the coolest thing would be to get all of this data in real-time. 