Pintail Technologies Newsletter - 3/26/08
In This Issue
Pintail & Salland Annoucement
Message from Salland's President
Contest Results?
What is a Real-time Dashboard?
Links

Today's Press Release

Salland Engineering

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Pintail and Salland Engineering Form Strategic Alliance

Leaders in Semiconductor Test Software Extend their Reach

 

Dallas, TX and Zwolle, Netherlands (March 26, 2008) - Pintail Technologies and Salland Engineering announced today that they have formed a strategic alliance that will enable them to extend their leadership in the semiconductor test software market. The two companies are sharing technology roadmaps and product integration plans as well as conducting joint marketing on a worldwide basis. Numerous customers of both company's products have recognized the synergistic fit between the product lines and have encouraged the companies to collaborate more closely.

 

"Pintail is clearly the world leader in providing Adaptive Test solutions," stated Paul van Ulsen, President of Salland Engineering. "Adaptive Test is a broad set of new techniques that allow users to improve test yield, test cost or test quality by dynamically adjusting the actions of the automatic test equipment (ATE) during production based upon statistical process control (SPC) algorithms. It is clear from the customers we have met with and the more that 400 copies of SwifTest™ currently in production, that Pintail is several years ahead of others in this rapidly growing new field."

 

"Salland's reputation for delivering outstanding solutions to complex test challenges is recognized worldwide," stated Taylor Scanlon, president and CEO of Pintail. "SE-PROBE™ is the most comprehensive real time wafer mapping and dynamic test cell controller on the market today. With over 1500 systems in production, Salland is clearly the world's leader in this segment. Salland's solutions for Adaptive Test are complementary to Pintail's and will further expand our solutions for test optimization and dynamic parts average testing (DPAT.) "

 

"We also value the strong worldwide capabilities of Salland's applications engineering team," added Scanlon. "As demand for both parties' products continues increase, our customers are expecting a high level of technical expertise and support across the test supply chain. Together we will have the strongest field support team in the semiconductor test software industry."

 

"This type of collaboration is very healthy for the industry," commented Kent Mazzia, Executive Director, World Wide Test Services for Maxim Integrated Products. "The challenges from our customers for semiconductor testing continue to increase and solutions from companies like Salland and Pintail provide strategic answers to those problems."

 

The parties plan to more closely integrate SEDana™ as the off-line analysis tool used to predict the performance of SwifTest-MX when used for test time reduction and SwifTest-AQ for adaptive quality improvement. In addition to these adaptive test solutions, test floor managers will now be able to integrate the real-time OEE capabilities of Pintail's TestScapeŽ system with the functionality of Salland's real time test cell controller SEPROBE.

 

"TestScape provides both test floor managers and upstream users of test subcons a real-time dashboard to monitor multiple test floors and heterogeneous brands of ATEs," stated Keith Arnold, Pintail's chief technology officer. "By adding Salland's SEPROBE as the test cell controller, test floors will be able to improve the data integrity of the enormous volumes of test results being monitored. SEPROBE also provides sophisticated capabilities to reduce retest costs, improve contact life cycle management, and other on-line test optimization."

 

The two parties combined customer base includes many of the leading semiconductor manufacturers and test subcons in the world including: Advantest, Analog Devices, Atmel, ASE, Avago Technologies, Bosch, CSR, Fairchild, Freescale, Hitachi, Infineon, IBM, Intel, KYEC, National Semiconductors, Maxim, Micrel, Micronas, Microchip, NXP, On-Semiconductor, Power Integrations, Qualcomm, Qimonda, Raytheon, Renesas, Sony, ST-Microelectronics, Toshiba, Teradyne, Texas Instruments, UTAC-Taiwan, Verigy and Volterra.

Real-time Cell Controller is Essential for Modern Test Operations

by Paul van Ulsen, President Salland Engineering
  

Paul van UlsenToday, the role of the cell controller has been promoted to a new level of criticality in modern test operations. Several significant industry trends are driving new requirements that are best served by companies like Salland Engineering and Pintail. These trends include:

 

n   Users want open software that provides a common interface that is independent of any ATE, prober or handler supplier.

n   Increased variability in the silicon process raises new challenges for test.

n   Increased variability in the test hardware must be neutralized.

n   Emergence of adaptive testing based upon statistical process control methods open new opportunities for our entire industry.

 

Proprietary test cell controllers of the past will not longer represent "Best Practices" for the test industry.

 

Need for Open Systems: The number of combinations of interfaces required to allow various tester types to communicate with different probers or handlers is huge. None of the equipment vendors have done a good job of supplying such interfaces and internally developed proprietary solutions cost a great deal to maintain. Salland's business model is ideally suited to serve this market need.

 

Variability in the silicon: 300mm technology and sub-90nm processes are changing the rules by which we have historically achieved yield entitlement. We can no longer wait for post processing to report issues on wafers containing thousands of die. Adaptive test techniques are increasingly necessary to maximize yield during test and real-time data access to test results is becoming essential.

 

Variability of test equipment: The test environment itself contributes a large amount of the variability to modern test. In order to manage this, systems need to be in place that can track all aspects of the hardware used within a test cell. This includes being able to track ATEs, probers/handlers, probe cards, etc. by serial number.

 

Emergence of Adaptive Test: As stated above, one result of these trends is the need for on-line adaptive test methods. To accomplish this, real-time data from the tester must be processed on-line by sophisticated software. This software has the same need to be neutral to any equipment vendor in order to that users may standardize new test methods.

 

Salland's modern implementation of the dynamic cell controller clearly addresses these challenges. By using a commercially supported controller, interfaces to the various combinations of equipment will be better supported and more robust. Job control can be standardized more effectively across an organization. Interactivity with the user's MES can more easily be integrated.

 

Since the majority of the data required for adaptive test comes from the tester itself, the probers and handlers are inefficient vehicles to implement modern software solutions. Historic efforts to add intelligence to the Prober/Handler will become less important in the future.

 

Finally, as real-time data becomes more accessible via standard; tester interfaces like Pintail's SwifTest, intelligent test cell controllers will need to be in place to allow operations to immediately respond to real-time issues in order to maximize efficiency. Real-time database systems like Pintail's TestScape will magnify the issue of poor data integrity generated by incorrect information being entered at the tester. Salland's test cell controllers allow users to immediately fix their data integrity problems at the point they are first created. OEE systems will be able to generate the accuracy demanded of best-in-class test operations.

 

As always, we expect to improve our own solutions by integrating the ideas and recommendations we receive from our customers. We look forward to working with Pintail and our expanded joint customer base to deliver the very best in test solutions.

What Happened to the Contest for Best Outlier Detection Icon?

chameleon green 

We will annouce the winner in the next issue of Pintail's Newsletter. There is still time for you to send me your ideas on what would be a good icon for Dynamic Outlier Detection and Rejection. The top ten entries will win a genuine Pintail polo shirt.

What is a Real-time Dashboard?

stop watch 

Have you ever wished that you could see test results from different brands of ATE systems and from different test floors including your various subcons with a common view? What if you could access all of this data over the web with any browser and with only a few points & clicks? And the coolest thing would be to get all of this data in real-time.

 

Think this is impossible?

 

Think again!

 

Pintail is delivering such a solution today!

 

Read about TestScape at http://www.pintail.com/db_solutions.php

Please forward this newsletter to anyone in your organization interested in learning more about on-line Adaptive Test, real-time monitoring or real-time test cell controllers. Also, drop me a note if you have feedback or recommendations for future articles.

 
Sincerely,
Taylor Scanlon
Pintail Technologies