DALLAS (October 15, 2007) -Pintail Technologies, a leading supplier of software solutions for semiconductor test, will introduce a powerful new device characterization tool at the 2007 International Test Conference (ITC: www.itctestweek.org) at the Santa Clara Convention Center, October 23-25.

TestScape-Charzilla makes the tedious task of characterizing complex semiconductor devices fast and easy.

"Comprehensive device characterization is a necessary but time-consuming part of good product engineering," stated Keith Arnold, CTO of Pintail. "As device complexity has risen, conventional tools lack the flexibility and speed to be able to efficiently process the dozens of files and operating conditions with the massive amounts of data involved in modern device characterization."

Charzilla™ delivers the following features:

§      Automated collection of split lot test data.

§      Intuitive user filtering of device data for inclusion or exclusion from analyses.

§      Ability to process massive amounts of data in minutes instead of hours.

§      Comprehensive, accurate multi-variant analysis across a wide range of characterization factors (PVT).

§      Flexible selection of dependent and independent variables.

§      Ability to perform full or partial characterizations with pause, edit and resume ease.

§       Interactive or batch mode analyses.

§       Automatic, configurable report generation.

§      Automatic data mining of final results summarizes significant variances.

"Charzilla is another example where Pintail's real-time SwifTest™ technology combined with the robustness of our TestScape™  data management system is able to deliver capabilities unmatched in the industry," stated Taylor Scanlon, President of Pintail Technologies. "We invite all test and product engineers and their managers to the demonstrations of this product at ITC booth #218."