Week 34 Report

Inspection:

64.3% Accept

Testing:

72.5% Pass

Week 34 Summary and August Poll 

Physical condition results jumped 10 points in Week 34 to over 64% from 54.2% in Week 33. The 2nd consecutive week of improvement. Electrical test yields also inched up to over 72% in Week 34, recovering some ground from Week 33's 70.8%, which had been the first decline after several weeks of incremental improvement.

With volumes in the industry trending up in August, there is still a significant high-risk list of electrical issues despite the improvement in yields.

Week 34 Quality Report, 2012

AVX Capacitor - High DF with specification for less than 0.05 and measured values over 0.07.

Substandard Part Listing

Xilinx XC4VLX40-10FFG1148I (Date Codes 1148 and 1129) - 34% failure - program error.

SEMTECH RCLAMP0J24P (Date Code not marked or labeled) - 50% failure - high clamping voltage, Vc.

Cypress Semiconductor  CY37032P44125AXC (Date Code 0833) - 8% failure - ID error.

NXP Semiconductor TDA7057AQ-N2 (Date Code not marked or labeled) - 8%failure - High output.
 

Xinlinx XC4020E (Date Code 0515) - 9% failure - program error.

Kemet  C1206C102J1GACTU (Date Code not marked or labeled) - 40% failure - Low capacitance.

Freescale Semiconductor MC912DG128ACPV-3K91D (Date Codes 0342 and 1033) - 17% failure - Blank check error.

AVX  06036C225KAT2A (Date Code not marked or labeled) - 78% failure - High dissipation factor, DF.

Littlefuse SMBJ200A (Date Code not marked or labeled) - 64% failure - Low breakdown voltage, Vbr, and high reverse current, Ir.

Toshiba TMPN3150B1AF (Date Codes 0925 and 0903) - 13% failure - open and short pins and bad protective diodes.

Infineon Technology PTFA211801E (Date Code not maked or labeled) - 10% failure - High Idss.