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MIL-STD 883/750 Pre-Cap Inspection May 10 - 13, 8am-5pm Phoenix, AZ
This course is designed to familiarize the learner with the details
included in specific sections of the MIL-STD 883 Test Method Standard
Microcircuits and MIL-STD 750 Test Method Standard for Semiconductor
Devices. This may be used in conjunction with your company's internal
documents. This course consists of lecture and hands-on using a
microscope (high and low power) with actual parts and video
presentations of anomalies. This will teach new inspectors inspection
skills and enhance inspector skills with previous or partial inspection
skills.
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MIL-STD 883 Rev G Course Entails:
- Section 2009 Low Power/ wires package conditions
external visual and high power
- Section 2010 Monolithic (single die) inspection
- Section 2017 Wires/ Package Conditions
- Section 2032 Hybrid packages (multiple die and
passive components/ substrates) Low and High Power
What the Learner
Receives: - Student manual
- Blackfox Certification
- Course duration for MIL-STD 883: 3 days
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MIL-STD 750 Rev E Course Entails:
- Section 2071 Low Power- wires, package conditions,
external visual
- Section 2069-2070 Fets/ Chips
- Section 2072 Transistors/ Chips
- Section 2073 Diodes/ Chips
- Section 2074 Diodes/ glass bodied-encapsulated
What the Learner Receives: - Student manual
- Blackfox Certification
- Course duration for MIL-STD 750: 1 day
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