Free admission - your invitation

You, your colleagues, friends and all interested persons are cordially invited attend the 2012 NI Technical Symposium, a leading graphical software design conference and exhibition being held in Cape Town and Midrand.

DATES: Cape Town: Tue 13 March 2012; Midrand: Thur 15 March 2012
TIMES: 08h30 to 16h30
VENUES:
Cape Town: Garden Court Eastern Boulevard, Cape Town
Midrand: Gallagher Convention Centre, Midrand

Join a thriving community of fellow innovators, educators, engineers, scientists and developers at this free one-day, multi-track conference, and explore the latest technologies to help you increase your productivity and improve your efficiency.

Click here to view the full agenda and session descriptions

Technical sessions include:

• Keynote presentation: Accelerating innovation and discovery with graphical system design
• Using PXI for complex data acquisition systems and high-end measurements
• Developing airborne geophysical instruments
• What's new in CompactRIO for embedded control and monitoring
• Hardware-in-the-loop and real-time testing techniques
• Making the move to LabVIEW Real-Time and LabVIEW FPGA programming
• Power measurements 101
• Introduction to object-oriented programming in LabVIEW   

Admission to the 2012 NI Technical Symposiums is free, but spaces are limited. To register, call 0800 203 199, or
 
Click here to register online free-of-charge

Event highlights include:

• Hear from industry experts: Industry engineers and academics discuss their applications and challenges they face.
• Free certification exams: Sign up to take your Certified LabVIEW Associate Developer (CLAD) exam for free at the conference.
• Software development: Sessions dedicated to software development for measurement and control applications
• Embedded control and monitoring: Gain an understanding of how to integrate measurements and control into an embedded device 
• Automated test and data acquisition: New and advanced hardware and software tools including real-time and FPGA technology.
• RF and wireless: Learn about next generation RF and wireless test technology.

Certified LabVIEW Associate Developer Exams

Additionally, attendees may take the free Certified LabVIEW Associate Developer (CLAD) Examination during the Conference. The examination takes 60 minutes to complete. Last year over 30 engineers, scientists and educators sat the CLAD exam. You will need to pre-register for this, contact Ronelle Boshoff ronelle.boshoff@ni.com, Tel 0800 203 199                

Further information
 
For further information please visit the event website
or contact NI South Africa on Tel: 0800 203 199 or email: ni.southafrica@ni.com

(PC & tablet editions)