APP LINKS
| IS MIMO TESTING COMPLEX?
Request your MIMO Antenna Techniques Poster by clicking on the image below
 | |
Spirent VR5
|
|
| WEBINARS | 
Earth and Enclosure Leakage Testing Wednesday April 18th, 1-2 PM CST  Thursday April 26, 2012 2pm EDT
|
| PROMOS |
 | | Leader LV5770 |
________________
2012 Budget tight?

Largest selection of refurbished equipment and rentals
click here
|
| UPCOMING EVENTS |
 April 17, 2012
LeParc, Thornhill
April 19, 2012
Holiday Inn, Pointe Claire_______________ May 16, 2012Crowne Plaza Toronto Airport Hotel
33 Carlson Court Toronto (Etobicoke)
VISIT

|
| OUR OFFICES |
 | |
Offices
|
Montreal (514) 856-0970 Toronto (905) 839-4290
Ottawa (613) 829-6859
Calgary (403) 247-3725
Edmonton (780) 328-0987 Vancouver
(604) 557-0715
|
|
|
Virtual VNA! Why Go Virtual?
|
 Virtual VNA! Why Go Virtual?
Virtual vector network analyzers increase productivity and lower costs for test, control, and design applications, capitalizing on the ever-increasing performance of personal computers. Engineers have used virtual instrumentation to downsize the equipment while experiencing significant productivity gains at a fraction of the cost of traditional instrument solutions.
PLANAR R54 Vector Reflectometer
PLANAR R54 is a Vector Reflectometer designed for S11 parameter measurement. It provides high accuracy measurements for magnitude and phase in frequencies between 85 MHz and 4.2 GHz. With a weight of only 8.8 oz, this device is portable so that you can conveniently take it into any testing environment. PLANAR R54 is the ultimate compact workhorse analyzer, providing a variety of analytical capabilities in the frequency and time domains.
- Frequency range: 85 MHz to 4.2 GHz
- Measures magnitude and phase of reflection coefficient, cable loss, and DTF
- Measurement time per point: 200 µs
- Frequency setting resolution: 10 Hz
- Powered via USB interface
- Compact size: 117x39x19 mm, lightweight: 8.8 oz
Contact Testforce to set up an onsite demo or product evaluation. For further details on Copper Mountain products, please visit their website.
|
| Tektronix Scope Tour 2012 |
Canadian Dates & Locations Fast-track registration in 30 secs
Tuesday,
May 22, 2012 Quebec City | Jitter Basics: Techniques for Fast Characterization of Signal Timing Learn More Register for this Event » | Thursday,
May 24, 2012 Montreal, QC | Fundamentals of Mixed Domain Analysis:
Testing Your Wireless Design Learn More
| Tuesday,
May 29, 2012 Ottawa, ON |
Jitter Basics: Techniques for Fast Characterization of Signal Timing
Learn More
Register for this Event »
| Thursday, May 31, 2012 Waterloo, ON | Debugging Your Digital Design: Fast and Efficiently Learn More
| Thursday,
May 31, 2012 Waterloo, ON | Fundamentals of Mixed Domain Analysis:
Testing Your Wireless Design Learn More
| Tuesday,
June 5, 2012 Edmonton, Canada | Debugging Your Digital Design: Fast and Efficiently Learn More
| Tuesday,
June 5, 2012 Edmonton, AB | Fundamentals of Mixed Domain Analysis:
Testing Your Wireless Design Learn More
| Thursday,
June 7, 2012 Calgary, AB | Debugging Your Digital Design: Fast and Efficiently Learn More
| Thursday,
June 7, 2012 Calgary, AB | Fundamentals of Mixed Domain Analysis:
Testing Your Wireless Design Learn More
| Tuesday,
June 12, 2012 Vancouver, BC | Fundamentals of Mixed Domain Analysis:
Testing Your Wireless Design Learn More
|
|
| Noise Figure / Noise Parameter Measurements | |
Introduction
Noise occurs naturally in any active device or circuit, and limits the minimum levels of useful signals. With a cell phone, for example, it can interfere with a weak signal, and interrupt a call. Therefore, it is important to design circuits to minimize the effects of noise. To do this, the noise must be quantified and measured in the form of noise parameters, comprised of Fmin, Gamma, opt (mag and phase), and Rn. Note, Noise Figure is a commonly referenced parameter when discussing LNAs, and most often refers to the 50ohm noise contribution of a device.
Ultra-Fast Noise Parameters
A new ultra-fast noise parameter measurement method is able to improve overall calibration and measurement time by a factor of 100X-400X, bringing measurements that could once take tens or hundreds of hours to tens of minutes. The new method has two key features that contribute to the breakthrough speed improvement:
1) The tuner is characterized with one set of states (physical tuner positions) that are selected to give a reasonable impedance spread over the frequency band of interest; and
2) the noise power measurement is swept over the frequency range at each state, so that the tuner only moves to each position once. This takes advantage of the fast sweep capability of modern instruments, as well as saving time by minimizing tuner movement.
The new noise parameter measurement method provides two orders of magnitude speed improvement. It also produces data that is smoother and has less scatter than the traditional method. The fast measurement speed eliminates temperature drift, and using a VNA with an internal noise receiver simplifies the setup and makes it much more stable and consistent. The much higher speed makes it practical to always do a full in-situ calibration to minimize errors, and to measure more frequencies to get a better view of scatter and cyclical errors, and to be able to use smoothing with more confidence. The higher frequency density also enhances accuracy by reducing shifts due to aliasing.
The 50ohm Noise Figure of a device can be directly measured using the Noise Parameter system, or extrapolated from the Noise Figure contours. Direct measurement is achieved by using an impedance tuner to present exactly 50 ohm to the DUT and measuring the associated noise figure (note, the tuner can correct for the non-50ohm system impedance normally presented without a tuner). Noise Figure extrapolation is a standard function within a noise parameter measurement system and uses mathematically determined contours to calculate the expected Noise Figure contribution at 50 ohm. read more
Material for this article is provided by:
|
| dbGuard Series RF Shielding Test Enclosure |  The Product... The Testforce dbGuard Series RF Shielding Test Enclosures allow you to conduct high quality RF level testing while maximizing your test equipment investment. These advanced RF shielding test enclosures provide the performance and durability you require. Whether in manufacturing, R&D, engineering, or service, the dbGuard's interchangeable test cartridges provides the versatility necessary for all departments and applications.
Offering an ergonomic single bar, easy latch system the Testforce dbGuard features a spacious interior well suited for testing large objects or perhaps multiple devices at one time while internally mounted antennas allow for Tx/Rx testing.
The dbGuard is fitted with Testforce's IASG -Inverted Asymmetrical Squarewave Gasket design enabling seamless and robust shielding to a superior isolation of up to 100 dB. The universal I/O panel is custom configurable with a wide range of options including filtered USB and high density RF connectors.
The Testforce dbGuard is precision machined from single solid block 6061 aluminum to obtain an RF tight environment that ensures the same compression every time. The interior is finished with an RF absorptive coating to minimize reflections.
With its high performance, features, flexibility, and reliable construction, the Testforce dbGuard Series is the RF test fixture of choice for every application.
The Benefits...
- The dbGuard comes in three standard sizes to satisfy most applications. Full dimensional customization is available.
- Interchangeable test cartridge design enables you to efficiently convert from one product to another in minutes reusing the same enclosure.
- Spacious interior allows you to test multiple devices on the same cartridge resulting in higher throughput and lower cost of test.
- Pneumatic or electromagnet option provides a fully automated solution.
- Single point design, manufacturing, and support services.
To get more info on the dbGuard, download the data sheet by clicking on the logo
|
|
EMC New Standards, New Technologies Seminar
| |
FINAL CALL! You're invited to our next educational seminar on EMC: New Standards, New Technologies.
A seminar series focused on the advancements in EMC Conducted & ESD, and Radiated RF presented by the leaders in EMC Testing.
An informative must-attend seminar series is coming to Canada. Brought to you by Teseq, PMM, and Testforce these FREE events will focus on a number of markets influenced by conducted, RF radiated -immunity and emissions. These include:
- Solar Panels
- Automotive eVehicles
- Smart Grid
- Medical Devices
- Wireless
Participants will be educated on changes to standards as well as technology updates.
Registration is easy and quick. Simply click on your city logo and follow the on screen instructions.
 | | Tuesday April 17,2012 |
|
 | | Wednesday April 18,2012 |
 | | Thursday April 19,2012 |
| | |
|
NEW Handheld Spectrum Analyzer 9.4 GHz
|
 HighEnd EMC Spectrum Analyzer up to 9,4GHz with ultra high sensitivity SPECTRAN HF-60100 V4
Our definitive EMC Spectrum Analyzer flagship. Perfect for Pre-Compliance test, optional TCXO time base etc. WORLD RECORD in handheld analyzer sensitivity down to -170dBm(Hz). Supports up to +40dBm RF input power to meet any Pre-Compliance measurement.
The HF-60100 V4 is included in our Pro Bundle 3.

Our latest V4 generation offer a vastly enhanced feature set with significantly faster sample time, more dynamic range, better IP3, reduced phase noise, greater demodulation bandwidth and improved LCD display compared to the previous V3 series. The V4 flagship HF-60100 V4 is suitable for Pre-Compliance and EMC/EMI tests. Its incredibly high -170dBm sensitivity (1Hz @ 3.6009GHz with preamp) sets it worlds apart from even its most current and extremely expensive competitors! But see for yourself.
Patented technology:
Based on a patented spectrum analyzer method Aaronia can offer a professional RF measurement at a spectacular price level.
Detect sources of interference, find out more about their causes, determine the frequency and intensity of the signal sources, measure limits and boost the functionality by using our high-end PC software.
Made in Germany:
All SPECTRANs are developed, individually produced and calibrated in Germany at the Aaronia factory. This guarantees highest standard so that Aaronia can offer every customer a full 10 year warranty for all SPECTRAN spectrum analyzer and EMC antennas.
Real-time Spectrum analyzer software (included for FREE):
All SPECTRAN units offer a USB interface with real-time remote control to your PC or MAC. The free analyzer software, which is available for MAC OS, Linux and Windows, transforms any SPECTRAN in a powerful measurement solution with great features (e.g. recording, multiple window display, histogram, waterfall diagram, unlimited number of markers, enhanced limits display etc.).
Download the Spectran HF-6000 Series datasheet
Download the Spectran Flyer
|
| Time Matters - How Power Meters Measure Fast Signals |

Time Matters - How Power Meters Measure Fast Signals
by Boonton
Power Measurements
Modern wireless and cable transmission technologies, as well as radar systems, present demanding challenges for device and system developers. Manufacturers of test and measurement equipment are driven to offer products that fully support today's needs, while anticipating the requirements of future technologies. Accuracy has always been a critical requirement in the test and measurement world, but modern technologies demand another must-have - highest data acquisition and processing speeds to allow accurate measurements of complex signal waveforms. This paper describes the different techniques RF peak power meters employ to meet these challenges.
Signal Triggering Modern peak power meters can measure virtually all types of pulsed or repeating signals. To achieve this, these instruments are equipped with sophisticated trigger capabilities. Prerequisite to any fast measurement is the synchronization of the instrument's measurement cycle to the actual event. Simply put, the input signal of interest has first to be "found." Specific trigger settings prepare the instrument for this synchronization and, once the desired event occurs, provide stable signal representations, allowing detailed signal analysis and accurate measurements. To be able to "look ahead," digital instruments often use special techniques such as circular acquisition buffers to facilitate display and measurement of pre-trigger events. Most RF peak power meters provide internal and external trigger capabilities. Internal triggering utilizes the envelope of the actual incoming RF signal, while external triggering utilizes a baseband trigger signal that is in some way synchronized with the RF input signal. read more Download the app note directly by clicking the logo.
|
How will GNSS modernization impact your business?
|  Issues dealing with GNSS Simulation
Modernization of the current GPS constellation is a program aimed at ensuring the continued success of GPS while more than doubling the number of signals available over the next few years. There are four GNSS systems (GPS, Galileo, GLONASS and Compass) and four Satellite Based Augmentation Systems (SBAS) which will be available by the middle of this decade. There are already over 60 GNSS and SBAS satellites in operation (including 32 from GPS) and more than 130 are planned. Markets affected by this include - Telecom & Wireless
- Transportation
- Civil Aviation
- Military & Defense
- Chipset & Technology
The core requirement of any GNSS receiver test, whether for development, integration or production purposes, is for a controlled, repeatable signal. For many tests, the signal control includes flexibility over test case, or scenario, conditions that enable performance testing at nominal and extreme or error-state conditions. This is only possible by simulation. To find out more about this topic, please click on the image below to visit the Spirent GNSS resource page. |
|
Choosing The Right SMU for You -ACT NOW!
|
 For characterization of semiconductor materials and devices, Keithley offers the widest selection and highest performance SMU instruments and semiconductor characterization systems available.
*To take advantage of this special promotion, contact your local Testforce office before May 31, 2012
|
Power Supply Measurement and Analysis
|
 Power Supply Measurement and analysis Primer
by Tektronix
A power supply is a component, subsystem, or system that converts electrical power from one form to another; commonly from alternating current (AC) utility power to direct current (DC) power. The proper operation of electronic devices ranging from personal computers to military equipment and industrial machinery depends on the performance and reliability of DC power supplies.
Historically, characterizing the behavior of a power supply has meant taking static current and voltage measurements with a digital multimeter and performing painstaking calculations on a calculator or PC. Today most engineers turn to the oscilloscope as their preferred power measurement platform.
Modern oscilloscopes can be equipped with integrated power measurement and analysis software which simplifies setup and makes it
easier to conduct measurements over time. Users can customize critical parameters, automate calculations, and see results not just
raw numbers in seconds.
This primer will focus on switch-mode power supply design measurements with an oscilloscope and application-specific software.Interested in more? Download the primer  here
|
|
|
|
|