APP LINKS
| IS MIMO TESTING COMPLEX?
Request your MIMO Antenna Techniques Poster by clicking on the image below
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Spirent VR5
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| WEBINARS | 
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| PROMOS | |
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| UPCOMING EVENTS |
 April 17, 2012
LeParc, Thornhill
April 19, 2012
Holiday Inn, Pointe Claire
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| OUR OFFICES |
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Offices
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Montreal
(514) 856-0970 Toronto
(905) 839-4290
Ottawa
(613) 829-6859
Calgary
(403) 247-3725
Edmonton (780) 328-0987 Vancouver
(604) 557-0715
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Powerful. Trustworthy. Meet the New Tektronix Bench Oscilloscopes
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New Models Offer Engineers More Models at Aggressive Price Points to Meet Embedded Design, Debug and Analysis Needs
Six new MSO/DPO4000B oscilloscope models With high-speed buses like USB 2.0 and Ethernet now being implemented in mainstream embedded designs, faster, more capable oscilloscopes with at least 1 GHz bandwidth are becoming the norm. This in turn has created a need for more flexibility in terms of number of channels and record length at this level of performance. To meet this need, Tektronix is introducing six new MSO/DPO4000B oscilloscopes with 1 GHz performance. The company will offer two channel models with 20 Mpoint record lengths and two and four channel "lite" versions with 5 Mpoint record length. Click here to learn more! Bandwidth upgrades for MSO/DPO3000, more serial bus support
Project requirements can change over time, creating a need for improved oscilloscope performance. With the addition of new bandwidth upgrade products for the MSO/DPO3000 series oscilloscopes, engineers can purchase the bandwidth they need now, and simply upgrade it (up to 500MHz) when project requirements change - without purchasing a whole new instrument. These oscilloscopes are ideal for general purpose debug, power analysis or serial and parallel bus analysis. Click here to learn more!
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Fundamentals of Dynamic Signal Analysis
|  Dynamic Signal Analysis (DSA) is an essential tool used to evaluate the behaviour and performance of a wide range of devices, vehicles and structures including white goods, automobiles, aircraft and spacecraft. Dynamic signal analysis is performed utilizing a special class of instrumentation that combines precision digitization capabilities with onboard processing to convert time domain signal to the frequency domain.
Unique test techniques, algorithms and software have been developed for different types of applications including modal, impact testing, acoustic, vehicle pass-by-noise measurements, rotating machinery data acquisition and environmental vibration testing; however, they still rely on the DSA instrument to acquire and transform signals to the frequency domain. This primer is ideal for those who are unfamiliar with the advantages of analysis in the frequency and the class of digitizers and analyzers designed for dynamic signal analysis. Click here to download and read this primer.
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The ABC's of Probes
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 Precision Measurements Start at theProbe Tip
Probes are vital to oscilloscope measurements. To understand how vital, disconnect the probes from an oscilloscope and try to make a measurement. It can't be done. There has to be some kind of electrical connection, a probe of some sort between the signal to be measured and the oscilloscope's input channel.
In addition to being vital to oscilloscope measurements, probes are also critical to measurement quality. Connecting a probe to a circuit can affect the operation of the circuit, and an oscilloscope can only display and measure the signal that the probe delivers to the oscilloscope input.
Thus, it is imperative that the probe have minimum impact on the probed circuit and that it maintain adequate signal fidelity for the desired measurements.
If the probe doesn't maintain signal fidelity, if it changes the signal in any way or changes the way a circuit operates, the oscilloscope sees a distorted version of the actual signal.
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EMC New Standards, New Technologies Seminar
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You're invited to our next educational seminar on EMC: New Standards, New Technologies.
A seminar series focused on the advancements in EMC Conducted & ESD, and Radiated RF presented by the leaders in EMC Testing. An informative must-attend seminar series is coming to Canada. Brought to you by Teseq, PMM, and Testforce these FREE events will focus on a number of markets influenced by conducted, RF radiated -immunity and emissions. These include: - Solar Panels
- Automotive eVehicles
- Smart Grid
- Medical Devices
- Wireless
Participants will be educated on changes to standards as well as technology updates. Registration is easy and quick. Simply click on your city logo and follow the on screen instructions.
 | | Tuesday April 17,2012 |
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 | | Wednesday April 18,2012 |
 | | Thursday April 19,2012 |
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Choosing The Right SMU for You -ACT NOW!
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 For characterization of semiconductor materials and devices, Keithley offers the widest selection and highest performance SMU instruments and semiconductor characterization systems available.
*To take advantage of this special promotion, contact your local Testforce office before May 31, 2012
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Upgrade Your Hipot Tester & SAVE 10%
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Now is the perfect time to refresh and recycle your old equipment, with the latest industry-leading Associated Research Hipot Testers. Simply trade-in your Criterion unit and you will automatically SAVE 10% OFF the cost of a NEW Associated Research Hipot Tester. Contact us today as this offer is valid until March 31, 2012. |
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