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SEPTEMBER 2011
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IN THIS ISSUE
Introducing the World's First Mixed Domain Oscilloscope
Fundamentals of the MDO4000 Series Mixed Domain Oscilloscope
From Lab...to Fab - Get the Testing Right
Upcoming Seminars in Your City
Check Out Our Featured Brands
HEADLINES 

Tektronix Breaks Innovation Barrier and Delivers Transformational New Oscilloscope Category 

 

Teseq Launches New Product Video Portal

VTI Introduces Glitch-free Sensor Simulation Instrument
PROMOS  
Keithley 2400 Series Promo

Keithley's Best Selling Source & Measure Instrument

FEATURED PRODUCTS

Associated Research 3780

500 VA AC Hipot Tester  

 

 

NEW Keithley 2401 Sourcemeter

Get Advanced Source and Measure Capabilities at 20V and 1A Signal Levels at an Unprecedented
Low Price

 

WEBINARS

Associated Research

Earth and Enclosure Leakage Testing  

September 21, 2011

2:00 pm - 3:00 pm EDT

 

View archived webinars here 

 

Keithley Logo Understanding the Basics of Electrical Measurements

September 29, 2011

2:00 PM EDT 

 

EVENTS

AUTOTESTCON 2011Click here for details

 

ITC 2011

 

International Test Conference
Click here for details
Introducing the World's First Mixed Domain Oscilloscope
Tektronix MDO4000 Series

Capture time-correlated analog, digital and RF signals for a complete system view of your device. See both time and frequency domains in one glance.

MDO4000 StoryMDO4000 Virtual Demo MDO4000 Features
Fundamentals of the MDO4000 Series Mixed Domain Oscilloscope  
Tektronix MDO4000 Screenshot

The MDO4000 series products from Tektronix represent a new paradigm in instrumentation; the Mixed Domain Oscilloscope, or MDO. These are the first instruments that are designed specifically to make time correlated measurements between digital, analog, and RF signals simultaneously in both the time and frequency domain.

 

In recent years, there has been an explosion in the use of wireless technology for data transfer. In almost every industry, wireless links are replacing or extending traditional wired communications. 

 

The proliferation of wireless technology is comprised of both licensed and unlicensed band technologies. Predominantly, a licensed band technology is used by a broadcaster or service  

provider (TV, radio, cell phone), while unlicensed technology operates over much shorter ranges in "free bands" (Bluetooth, Wireless LAN, Garage Door openers, remote keyless entry).  

 

Modern wireless systems use sophisticated modulation schemes. These modulation schemes are generally implemented by using digital signal processing, DSP, and can be expressed in Cartesian complex form of I (In-Phase) and Q (Quadrature) data which, in turn, is used to modulate the transmitted RF signal.  

 

Almost by definition, then, modern wireless technologies span both time and frequency domains. In addition, the signals exist in three domains: digital, analog, and RF. Click here to continue reading this application note. 

 

From Lab  to Fab - Get the Testing Right
Keithley Lab Tracer

Moving new products from R&D to Production requires qualification of the testing program. This is much easier if the same equipment

is used in both locations, but requires instrumentation with the accuracy, speed, and flexibility to handle both jobs.

 

Electrical testing programs in R&D and production typically have different sets of priorities, even though many of the measurements are the same. In R&D, I-V (current-voltage) data may be plotted

in detail and closely examined. In production, fast repeatable I-V measurements are needed for comparison to a few standard values for product acceptance or parts binning decisions.

 

Correlation between lab and fab I-V test data is needed to ensure that production items hit performance and reliability targets. Duplicating lab instruments in production may seem like a logical answer, but if equipment wasn't selected with that in mind, it may not be practical. To ensure that measurement equipment performs well in both lab and fab, several criteria should be considered. These include the number of measurement points required on the DUT, sensitivity, repeatability, speed, programmable features, and data handling capabilities.

To continue reading this article click here.

Space 550
Upcoming Seminars in Your City
MDO4000 Seminar QC

September 20th - Quebec City (EPTECH Show)

11:30 AM - 12:30PM 

Introducing the Mixed Domain Oscilloscope

This short seminar will introduce the MDO4000 family and show how this instrument provides correlated measurements between the time-domain, digital-domain AND  the frequency-domain. Click here for more info 

 

tEK mso 400

September 21st - Halifax, NS

10:00 AM - 3:00PM 

Tektronix Power2Solve 2011

Come spend a day with our industry experts and learn the latest troubleshooting techniques on world-class oscilloscopes for your embedded system design. This FREE one day seminar  

will provide hands-on training focused on the latest techniques for digital debug, verification of serial and parallel data, jitter and power analysis. Click here for more info 

 

September 26 to 30, 2011 - Canada Wide2011 Fluke MET/CAL Meetings

 

Fluke MET/CAL User Group Meetings 

A NEW Series of MET/CAL User Group Meetings is back by popular demand! Lead once again by Bill Spath, these meetings will give you an ideal opportunity to meet with software experts from Fluke Precision Measurement and learn how to maximize your investment in Fluke metrology software. Locations include Montreal, Ottawa, Toronto, Edmonton and Vancouver. Click here for more info

 

Featured Brands
   Featured Brand - Aeroflex     Featured Brand - Boonton   Cascade Microtech
 Featured Brand - California Inst.       Featured Brand - Fluke     Featured Brand - Keithley      Featured Brand - Kepco      Featured Brand - Leader    Featured Brand - Sorensen  
Featured Brand Spirent     Featured Brand - Tektronix        Featured Brand - VTI      
     
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