New classes of "smart" instruments are helping researchers on the leading edge of technology to reduce their cost of test while accelerating product development.

Semiconductor and passive component industries are continuously
pushing their development processes to higher levels of integration and complexity to keep pace with consumer electronic needs. As the complexity of electronic devices grows, and new materials are required, the amount and sophistication of testing increases. Researchers and development engineers are faced with increasing pin counts on new electronic devices, and a wider array of materials that must be evaluated for possible use in these devices. In both cases, more measurement channels are needed in test systems to maintain acceptable throughput and lower costs. Click here to continue reading this article

Learn the essentials of data acquisition and how to avoid common measurement errors

Data acquistion is more than just a collection of plug-in boards and analog-to-digital (ADC) converters.  Effective data acquisition systems accurately convert physical parameters, such as temperature, position, flow, strain, and speed, into information that can be used for evaluation, performance verification and analysis.

Integrated data acquisition systems provide the most accurate measurement results by minimizing sources of error and maximizing the performance of the transducer-instrument signal path. However, there are also many sources of external electrical interference that must be considered and properly addressed to ensure the most accurate
measurement results.We will discuss the fundamentals of data acquisition, identify common sources of measurement error, and explore techniques to maximize the performance of your measurement system. To learn more click here