DART Presentations at IMSC 2012
Here is a listing of the DART presentations at the upcoming IMSC meeting. From reaction monitoring to traditional medicines to forensic toxicology and food safety, DART is becoming a dependable platform for rapid problem solving. Just click on the titles to see the abstracts.
MONDAY
Presentation number : PMo-169
High Throughput Molecular Weight Confirmation of Pharmaceutical Compounds Using DART MS Analysis with Ultra-fast Polarity SwitchingÂ
Teruhisa Shiota 1; Hirotaka Honda 1; Jun Watanabe 2; Kazuo Mukaibatake 2
1: AMR, Inc., Tokyo, Japan 2: Shimadzu Corporation, Kyoto, Japan 3: Shimadzu Techno Research, Kyoto, Japan
Presentation number : PMo-170 Componential Analysis of Pepper of Various Origins Using DART-MS Using Ultra-fast Polarity Switching FUMIHIKO USUI 1; Teruhisa Shiota 1; Manabu Ueda 2; Kazuo Mukaibatake 2; Junko Iida 2; Tsubasa Ibushi 3; Yasuhiko Bando 1; Jun Watanabe 2 1: AMR INCORPORATED Tokyo,Japan 2: Shimadzu Corporation, Kyoto, Japan 3: Shimadzu Techno Research, Kyoto, Japan Presentation number : PMo-199 Achieving High Resolution in a Benchtop Resistive Glass Drift Tube Ion Mobility Spectrometer WILLIAM C NETOLICKY 1; PAULA HOLMES 1; FACUNDO FERNANDEZ 2; JOE TICE 3; BRIAN MUSSELMAN 3 1: Photonis USA, Sturbridge, USA 2: Georgia Institute of Technology, Atlanta GA, USA 3: IonSense Inc., Saugus MA, USA Venue：Room A 15:00 - 17:00 Presentation number : S07-1500 [Keynote Lecture] What is the Opposite of Pandora's Box? Direct Analysis, Ambient Ionization, and a New Generation of Atmospheric Pressure Ion Sources. Robert B Cody 1 1: JEOL USA, Inc. TUESDAY
Presentation number : PTu-144 Open Spot Ambient Ionization Technology for Near-Instant Determination of Sample Characteristics by using DART-MS Musselman D Brian 1; Joseph LaPointe 1; Elizabeth Crawford 1 1: IonSense, Inc.
Presentation number : PTu-146 Rapid screening and quantitation of pesticides in fruit commodities by Direct Analysis in Real Time (DART) ambient ionization mass spectrometry Elizabeth A Crawford 1; Brian D Musselman 1 1: IonSense, Inc., Saugus, MA, USA
Presentation number : PTu-160 Direct analysis of asphaltene by DART FT MS Hugues PREUD'HOMME 1; Felipe CARDOSO 2,3; Bruno GRASSL 4; Brice BOUYSSIERE 1; Herve CARRIER 2 1: IPREM / LCABIE, University of Pau, Pau, France 2: LFC-R, UMR 5150, University of Pau, Pau France 3: Centro de Pesquisas Leopoldo Americo Miquez de Mello, PETROBRAS/CENPES, Rio de Janeiro, Brazil 4: IPREM / ECP, UMR 5254, University of Pau, France
WEDNESDAY
Presentation number : PWe-088 A screen using DART-MS to identify novel components of a pheromone synthesis pathway in Drosophila melanogaster Yin Ning Chiang 1; Joanne Y Yew 1,2 1: National University of Singapore, Singapore, Singapore 2: Temasek Life Sciences Laboratory, Singapore, Singapore
Presentation number : PTh-110 High-Speed Survey Method for Photo-degradation Products of Pharmaceuticals Using UV-LED Lighting Device and DART-TOF Mass Spectrometer Toshio Tashima 1; Kaori Asano 2; Takeyuki Suzuki 2; Tsuyoshi Matsuzaki 2; Takeshi Nakano 3 1: GeneStem Co. Ltd., Osaka, Japan 2: The Institute of Scientific and Industrial Research, Osaka University, Osaka, Japan 3: Research Center for Environmental Preservation, Osaka University, Osaka, Japan
Presentation number : PTh-125 Ions Observed in DART-MS Analysis of Pharmaceuticals Containing Various Functional Groups on Normal and Reverse Phase TLC Plates Kaori Asano 1; Toshio Tashima 2; Takeyuki Suzuki 1; Tsuyoshi Matsuzaki 1; Takeshi Nakano 3 1: The Institute of Scientific and Industrial Research, Osaka University 2: GeneStem Co., Ltd 3: Research Center for Environmental Preservation, Osaka University
FRIDAY
Venue：Room D Date：Sep 21(Fri), 2012 09:00 - 11:00 Presentation number : S44-0940 Advances in Ambient Ionization and Imaging using DART and Microplasma Ion Sources Facundo M Fernandez 1; Joel Keelor 1; Rachel Bennett 1; Prabha Dwivedi 1; Joshua Symonds 2; Reuben Gann 1; Thomas Orlando 1,2 1: Georgia Institute of Technology/School of Chemistry and Biochemistry, Atlanta, GA, USA 2: Georgia Institute of Technology, School of Physics | 
